Olympus UPLANFL 40x Objective pln10x Semiconductor wafer and die inspection

Semiconductor wafer and die inspection requiring highest NA reflected light

100 lm Power Consumption 80% less than halogen equivalent LED Lifespan 50

• Publication-quality image capture for research

Multi-specimen labs requiring flexibility across oil

Olympus UPLANFL 40x Objective pln10x Semiconductor wafer and die inspectionOLYMPUS UPLANFL 40X UNIVERSAL PLAN FLUORITE OBJECTIVE Achieve high quality imaging with excellent flat field correction and fluorescence performance, featuring: 40x magnification with 0. 75 numerical aperture for high resolution imaging 0. 51mm working distance for standard preparations Universal Plan Fluorite design combining flat field correction with fluorescence optimization RMS thread mount for universal compatibility with CX, BX, and IX series